Open AccessYield improvement by redundancy method for component calibration
Author(s) -
Enikeeva F.,
Morche D.,
Oguz A.
Publication year - 2013
Publication title -
electronics letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.375
H-Index - 146
ISSN - 1350-911X
DOI - 10.1049/el.2012.4170
Subject(s) - redundancy (engineering) , component (thermodynamics) , calibration , yield (engineering) , computer science , mathematics , algorithm , reliability engineering , statistics , engineering , materials science , physics , metallurgy , thermodynamics
The benefits of a redundant channels methodology for the component calibration are explored. Proposed is a normal approximation of the yield in order to estimate the number of redundant components needed to provide a minimal area occupied by the components.