Self‐calibrating evaluation method for microwave interferometry measurements
Author(s) -
Prihoda M.,
Hoffmann K.
Publication year - 2013
Publication title -
electronics letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.375
H-Index - 146
ISSN - 1350-911X
DOI - 10.1049/el.2012.3122
Subject(s) - microwave , interferometry , calibration , materials science , optics , remote sensing , electronic engineering , computer science , physics , engineering , telecommunications , mathematics , statistics , geology
Microwave interferometry provides a sensitive measurement of amplitudes and phases of reflections. Basically, the interferometric system can be used to measure a non‐electrical quantity, such as distance. Presented is a new method to evaluate data from a microwave interferometer. The method is compared with the previously used procedure. The new method provides more accurate results and also offers the possibility of self‐calibration.
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