Open AccessThru‐reflect‐line calibration for substrate integrated waveguide devices with tapered microstrip transitions
Author(s) -
Caballero E. Diaz,
Belenguer A.,
Esteban H.,
Boria V.E.
Publication year - 2013
Publication title -
electronics letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.375
H-Index - 146
ISSN - 1350-911X
DOI - 10.1049/el.2012.3027
Subject(s) - microstrip , materials science , substrate (aquarium) , calibration , waveguide , optoelectronics , line (geometry) , electronic engineering , optics , engineering , physics , mathematics , geology , oceanography , geometry , quantum mechanics
One of the main problems when exciting or measuring substrate integrated waveguide (SIW) devices lies in the need of a good interconnection with planar structures. In this reported work, the negative effects produced by the connectors and the tapered microstrip‐to‐SIW transitions are de‐embedded from the measurements of the SIW structure by a thru‐reflect‐line calibration with an adequate and cheap SIW calibration kit.