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Reduced threshold current dilute nitride Ga(NAsP)/GaP quantum well lasers grown by MOVPE
Author(s) -
N. Hossain,
Stephen J. Sweeney,
Stephan Rogowsky,
R. Ostendorf,
J. Wagner,
S. Liebich,
M. Zimprich,
Kerstin Volz,
Bernardette Kunert,
W. Stolz
Publication year - 2011
Publication title -
electronics letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.375
H-Index - 146
eISSN - 1350-911X
pISSN - 0013-5194
DOI - 10.1049/el.2011.1927
Subject(s) - optoelectronics , metalorganic vapour phase epitaxy , materials science , laser , lasing threshold , diode , quantum well , epitaxy , substrate (aquarium) , semiconductor laser theory , wavelength , optics , layer (electronics) , nanotechnology , physics , oceanography , geology
Recent significant improvements in Ga(NAsP)/GaP quantum well lasers grown by metal organic vapour phase epitaxy on a GaP substrate are reported. At room temperature, the devices show a threshold current density of 4.0 kAcm(-2) at a lasing wavelength of 981 nm for a cavity length of 1 mm and a characteristic temperature of 58 K in the temperature region of 220-295 K. These improvements further verify the possible application for the novel III/V Ga(NAsP)/GaP material system to integrate long-term stable laser diodes in a standard CMOS-compatible electronic chip

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