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Fabrication and characterisation of solar-blind Al0.6Ga0.4N MSM photodetectors
Author(s) -
Necmi Bıyıklı,
Ïbrahim Kimukin,
Turgut Tut,
O. Aytür,
Ekmel Özbay
Publication year - 2005
Publication title -
electronics letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.375
H-Index - 146
eISSN - 1350-911X
pISSN - 0013-5194
DOI - 10.1049/el:20048028
Subject(s) - responsivity , optoelectronics , materials science , photodiode , fabrication , photodetector , metalorganic vapour phase epitaxy , detector , microwave , optics , physics , telecommunications , nanotechnology , epitaxy , computer science , medicine , alternative medicine , pathology , layer (electronics)
Solar-blind metal-semiconductor-metal (MSM) photodiodes based on MOCVD-grown Al0.6Ga0.4N template have been fabricated and tested. AlGaN detector samples were fabricated using a microwave compatible fabrication process. Optical transmission, current-voltage, spectral responsivity, and temporal pulse response measurements were carried out. The fabricated devices had very low leakage current and displayed true solar-blind response with ∼255 nm cutoff wavelength. © IEE 2005

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