
Learning a Deep Metric: A Lightweight Relation Network for Loop Closure in Complex Industrial Scenarios
Author(s) -
Sheng Jin,
Liang Chen,
Yu Gao,
Changqing Shen,
Rongchuan Sun
Publication year - 2021
Publication title -
chinese journal of electronics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.267
H-Index - 25
eISSN - 2075-5597
pISSN - 1022-4653
DOI - 10.1049/cje.2020.11.005
Subject(s) - closure (psychology) , metric (unit) , relation (database) , loop (graph theory) , computer science , artificial intelligence , mathematics , topology (electrical circuits) , data mining , operations management , engineering , economics , combinatorics , market economy
The similarity metric in Loop closure detection (LCD) is still considered in an old fashioned way, i.e . to pre‐define a fixed distance function, leading to a limited performance. This paper proposes a general framework named LRN‐LCD, i.e . a Lightweight relation network for LCD, which combines the feature extraction module and similarity metric module into a simple and lightweight network. The LRN‐LCD, an end‐to‐end framework, can learn a non‐linear deep similarity metric to detect loop closures from different scenes. Moreover, the LRN‐LCD supports image sequences as input to speed up the similarity metric in real‐time applications. Extensive experiments on several open datasets illustrate that LRN‐LCD is more robust to strong condition variations and viewpoint variations than the mainstream methods.