Open AccessInvestigations on the Effect of Electrical Contact Degradation on High Speed Wide‐Band Signal Integrity
Author(s) -
Wang Ziren,
Gao Jinchun,
Ji Rui,
Bilal Hafiz Muhammad
Publication year - 2020
Publication title -
chinese journal of electronics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.267
H-Index - 25
eISSN - 2075-5597
pISSN - 1022-4653
DOI - 10.1049/cje.2020.03.007
Subject(s) - waveform , degradation (telecommunications) , signal (programming language) , signal integrity , capacitance , computer science , materials science , electrical contacts , electronic engineering , acoustics , electrical engineering , optoelectronics , engineering , telecommunications , physics , interconnection , electrode , quantum mechanics , programming language , radar
Electrical contact degradation will affect the signal integrity resulting in poor communication performance. In the present work, the effect of electrical contact degradation on wide‐band digital signal integrity was studied using both the theoretical analysis and experimental testing. The characteristics of digital signals with rise times of 200ps, 400ps, 600ps and 800ps through connectors with different degradation levels were studied. The maximum bandwidth of these signals can reach up to 1.75GHz. An equivalent model of the connector with degraded contact surface was developed and the experimental results are consistent with the model results approximately. The influence of capacitance characteristics caused by degraded contact surface on digital signal waveform was calculated and analyzed. The results of this paper are helpful in developing a better understanding of the characteristics of wide‐band digital signal waveforms through the degraded contact surface and provide a theoretical support to identify failure features in fault diagnosis.