Open AccessEFI System Performance Reliability Evaluation Based on Degradation Data Distribution
Author(s) -
Cui Runlong,
Chen Tao
Publication year - 2018
Publication title -
chinese journal of electronics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.267
H-Index - 25
eISSN - 2075-5597
pISSN - 1022-4653
DOI - 10.1049/cje.2018.05.012
Subject(s) - degradation (telecommunications) , reliability (semiconductor) , computer science , reliability engineering , automotive industry , failure mechanism , automotive engineering , engineering , telecommunications , power (physics) , physics , quantum mechanics , structural engineering , aerospace engineering
The performance of Electronic fuel injection (EFI) systems has been significantly improved owing to the enhancement of materials and components. Thus, it is very difficult to obtain enough time‐to‐failure data for a specific time. This raises a big challenge with regard to traditional reliability evaluations of EFI systems since the evaluations lack abundant failure data. To resolve the problem, this paper proposes a new method. By analyzing the working principle and failure mechanism of an EFI system, the extractionmethod and degradation analysis of the system parameters are first carried out. Then, a temperature stress degradation model of linear regression based on degradation data distribution is presented. Experimental results show that EFI system performance reliability can be effectively evaluated. This can provide a theoretical basis for an overall performance estimation and proactive maintenance of automotive ECUs.