Open AccessA Test Case Generation Approach Based on Sequence Diagram and Automata Models
Author(s) -
Zhang Chen,
Duan Zhenhua,
Yu Bin,
Tian Cong,
Ding Ming
Publication year - 2016
Publication title -
chinese journal of electronics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.267
H-Index - 25
eISSN - 2075-5597
pISSN - 1022-4653
DOI - 10.1049/cje.2016.03.007
Subject(s) - correctness , computer science , automaton , sequence (biology) , sequence diagram , algorithm , test case , event (particle physics) , process (computing) , deterministic finite automaton , theoretical computer science , software , programming language , unified modeling language , machine learning , physics , regression analysis , quantum mechanics , biology , genetics
To improve the test automation in software development process, following the researches on test cases generation technology from models, an incremental test case generation approach is proposed based on finite automata, and Event deterministic finite automata (ETDFA) are employed to describe the sequence diagram models of system interaction. By model checked with Propositional projection temporal logic (PPTL), the correctness of ETDFA is verified. Then we can get the composed automata by synthesis rules, and generate the test cases incrementally by test cases generation algorithm. Case studies are presented to show that this approach enables to improve test cases correctness, and reduce the complexity of test cases generation process.