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Large‐area topography analysis and near‐field Raman spectroscopy using bent fibre probes
Author(s) -
Prikulis J.,
Murty K. V. G. K.,
Olin H.,
Käll M.
Publication year - 2003
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1046/j.1365-2818.2003.01142.x
Subject(s) - raman spectroscopy , near field scanning optical microscope , materials science , optics , rhodamine 6g , microscopy , bent molecular geometry , spectroscopy , excitation , optical microscope , analytical chemistry (journal) , chemistry , scanning electron microscope , physics , quantum mechanics , composite material , fluorescence , chromatography
Summary We present a method for combined far‐field Raman imaging, topography analysis and near‐field spectroscopy. Surface‐enhanced Raman spectra of Rhodamine 6G (R6G) deposited on silver nanoparticles were recorded using a bent fibre aperture‐type near‐field scanning optical microscope (NSOM) operated in illumination mode. Special measures were taken to enable optical normal‐force detection for control of the tip–sample distance. Comparisons between far‐field Raman images of R6G‐covered Ag particle aggregates with topographic images recorded using atomic force microscopy (AFM) indicate saturation effects due to resonance excitation.

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