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Near‐field Raman spectroscopy using a sharp metal tip
Author(s) -
Hartschuh A.,
Anderson N.,
Novotny L.
Publication year - 2003
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1046/j.1365-2818.2003.01137.x
Subject(s) - raman spectroscopy , carbon nanotube , raster scan , materials science , spectroscopy , resolution (logic) , optics , near and far field , metal , field (mathematics) , coherent anti stokes raman spectroscopy , image resolution , analytical chemistry (journal) , raman scattering , nanotechnology , chemistry , physics , mathematics , chromatography , quantum mechanics , artificial intelligence , computer science , pure mathematics , metallurgy
Summary Near‐field Raman spectroscopy with a spatial resolution of 20 nm is demonstrated by raster scanning a sharp metal tip over the sample surface. The method is used to image vibrational modes of single‐walled carbon nanotubes. By combining optical and topographical signals rendered by the single‐walled carbon nanotubes, we can separate near‐field and far‐field contributions and quantify the observed Raman enhancement factors.