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Characterizing the deformed state in Al‐0.1 Mg alloy using high‐resolution electron backscattered diffraction
Author(s) -
Hurley P. J.,
Humphreys F. J.
Publication year - 2002
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1046/j.1365-2818.2002.00997.x
Subject(s) - electron backscatter diffraction , field emission gun , resolution (logic) , materials science , diffraction , angular resolution (graph drawing) , image resolution , transmission electron microscopy , electron diffraction , aluminium , alloy , characterization (materials science) , optics , electron microscope , metallurgy , physics , nanotechnology , computer science , mathematics , combinatorics , artificial intelligence
Summary The application of high resolution electron backscatter diffraction (EBSD) in a field emission gun scanning electron microscope to the characterization of a deformed aluminium alloy is discussed and the results are compared with those obtained by transmission electron microscopy. It is shown that the adequate spatial resolution, accompanied by the improvement in angular resolution to ~0.5° that can be achieved by data processing, together with the extensive quantitative data obtainable, make EBSD a suitable method for characterizing the cell or subgrain structures in deformed aluminium. The various methods of analysing EBSD data to obtain subgrain sizes are discussed and it is concluded that absolute subgrain reconstruction is the most accurate.