Premium
Near‐field second harmonic imaging of the c/a/c/a polydomain structure of epitaxial PbZr x Ti 1– x O 3 thin films
Author(s) -
Smolyaninov I. I.,
Liang H. Y.,
Lee C. H.,
Davis C. C.,
Nagarajan V.,
Ramesh R.
Publication year - 2001
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1046/j.1365-2818.2001.00885.x
Subject(s) - second harmonic generation , diffraction , epitaxy , field (mathematics) , optics , harmonic , resolution (logic) , microscopy , materials science , thin film , condensed matter physics , chemistry , physics , nanotechnology , laser , mathematics , layer (electronics) , quantum mechanics , artificial intelligence , computer science , pure mathematics
Near‐field optical second harmonic microscopy has been applied to imaging of the c/a/c/a polydomain structure of epitaxial PbZr x Ti 1– x O 3 thin films in the 0 < x < 0.4 range. Comparison of the near‐field optical images and the results of atomic force microscopy and X‐ray diffraction studies show that an optical resolution of the order of 100 nm is achieved. Symmetry properties of the near‐field second harmonic signal allow us to obtain good optical contrast between the local second harmonic generation in c‐ and a‐domains. Experimentally measured near‐field second harmonic images have been compared with the results of theoretical calculations. Good agreement between theory and experiment is demonstrated.