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Shaping the reflection near‐field optical probe: finite domain time difference modelling and fabrication using a focused ion beam
Author(s) -
Spajer M.,
Parent G.,
Bainier C.,
Charraut D.
Publication year - 2001
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1046/j.1365-2818.2001.00860.x
Subject(s) - finite difference time domain method , optics , reflection (computer programming) , offset (computer science) , materials science , focused ion beam , fabrication , near and far field , ion , physics , computer science , medicine , alternative medicine , pathology , quantum mechanics , programming language
An optical fibre ending in a trihedral tip is proposed as a convenient probe for reflection near‐field optical microscopy in emission/collection mode. Its shape is obtained by ion milling. A first example of manufacturing and numerical models using the bi‐dimensional FDTD method is presented. It confirms the strong influence of the facet angle on the intensity reflected by the probe, which is predicted by a rough analysis. This method can help us to optimize the ‘reflection probe’ by reducing this offset signal.