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Probe design optimization for a high‐resolution scattering‐type scanning near‐field optical microscope
Author(s) -
Sasaki Y.,
Sasaki H.
Publication year - 2001
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1046/j.1365-2818.2001.00793.x
Subject(s) - near field scanning optical microscope , optics , scattering , resolution (logic) , optical microscope , microscope , materials science , radius , near and far field , physics , scanning electron microscope , computer science , computer security , artificial intelligence
The scattering‐type scanning near‐field optical microscope (SNOM) has a probe with a sharp tip for use in high resolution imaging. As sharp a tip as possible is generally considered ideal for the observations, but actually, a sharp tip does not always provide a high resolution SNOM image. We numerically examined the scattering property of the SNOM probe by the three dimensional finite difference time domain method. In this paper, we show the criterion for the ideal scattering probe which satisfies the simple relation between radius and taper angle of the tip.