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Electron probe microanalysis using soft X‐rays – a review. Part 1: Instrumentation, spectrum processing and detection sensitivity
Author(s) -
Love G.,
Scott V. D.
Publication year - 2001
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1046/j.1365-2818.2001.00789.x
Subject(s) - instrumentation (computer programming) , electron probe microanalysis , library science , sensitivity (control systems) , citation , engineering physics , physics , analytical chemistry (journal) , computer science , chemistry , optics , engineering , scanning electron microscope , electronic engineering , chromatography , operating system