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Adaptive aberration correction in a two‐photon microscope
Author(s) -
Neil M. A. A.,
Juškaitis R.,
Booth M. J.,
Wilson T.,
Tanaka T.,
Kawata S.
Publication year - 2000
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1046/j.1365-2818.2000.00770.x
Subject(s) - wavefront , optics , microscopy , materials science , optical sectioning , lens (geology) , adaptive optics , two photon excitation microscopy , microscope , oil immersion , spherical aberration , deformable mirror , wavefront sensor , optical microscope , physics , scanning electron microscope , fluorescence
We demonstrate aberration correction in two‐photon microscopy. Specimen‐induced aberrations were measured with a modal wavefront sensor, implemented using a ferro‐electric liquid crystal spatial light modulator (FLCSLM). Wavefront correction was performed using the same FLCSLM. Axial scanned ( x z ) images of fluorescently labelled polystyrene beads using an oil immersion lens show restored sectioning ability at a depth of 28 µm in an aqueous specimen.