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Charge effect in point projection images of carbon fibres
Author(s) -
Prigent M.,
Morin P.
Publication year - 2000
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1046/j.1365-2818.2000.00714.x
Subject(s) - magnification , diffraction , projection (relational algebra) , charge density , optics , charge (physics) , point (geometry) , nanometre , enhanced data rates for gsm evolution , materials science , charge coupled device , microscope , physics , geometry , mathematics , computer science , algorithm , telecommunications , quantum mechanics
Nanometre‐sized carbon fibres across holes have been observed in a lensless point projection field‐emission microscope operating between 100 and 300 eV. At sufficiently high magnification fringe patterns appear; with the help of simulations we show that they are strongly dependent on the charge density of the fibres. These patterns are characterized by an odd number of fringes with a central fringe that becomes very bright as the charge increases. Average diameter and linear charge density have been obtained with remarkable precision from analysis of fringes. Charge distribution from the middle to the edge of fibres has been investigated as well as narrowings at localized places on the fringe pattern. From these two examples, the limits of the models used for the simulations and those of the data acquisition system are discussed. Finally, this work emphasizes the fact that the fringe pattern masks the actual form of the fibre and that it is necessary to take account of the charge effect to interpret this diffraction pattern.

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