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Peculiarities of imaging one‐ and two‐dimensional structures in an emission electron microscope. 1. Theory
Author(s) -
Nepijko S. A.,
Sedov N. N.,
Ziethen CH.,
Schönhense G.,
Merkel M.,
Escher M.
Publication year - 2000
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1046/j.1365-2818.2000.00713.x
Subject(s) - cathode , microscope , anode , electron , electron microscope , resolution (logic) , position (finance) , work function , electrode , materials science , field electron emission , image resolution , optics , sample (material) , physics , chemistry , computer science , quantum mechanics , finance , artificial intelligence , economics , thermodynamics
Local changes in work function cause deviations of the electrical microfield near a sample surface as a result of the uniform accelerating field distribution between the sample (cathode) and the extractor electrode (anode). This results in a change in the electron trajectories. As a consequence, the microscope image shows remarkable changes in position, size, intensity and lateral resolution of distinct details, which can be quantitatively described by the calculations presented here. Analysing these effects in the image gives an opportunity to determine the real lateral size of the observed structures and the distribution of local contact potentials.