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Grain size distribution analysis in polycrystalline LiF thin films by mathematical morphology techniques on AFM images and X‐ray diffraction data
Author(s) -
M. Cremona,
Maria D. Mauricio,
S Carmo,
Prioli,
Nunes,
Zanette,
Caride,
Albuquerque
Publication year - 2000
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1046/j.1365-2818.2000.00661.x
Subject(s) - crystallite , diffraction , grain size , materials science , lithium fluoride , thin film , morphology (biology) , deposition (geology) , analytical chemistry (journal) , crystallography , optics , composite material , chemistry , nanotechnology , metallurgy , physics , geology , inorganic chemistry , paleontology , chromatography , sediment
The influence of the deposition temperature on the grain size of polycrystalline lithium fluoride (LiF) thin films is studied using a mathematical morphology method. On atomic force microscopy images of the LiF surface, the grain sizes and shapes are determined by applying the watershed technique, together with a shape factor algorithm. Also, the domain size of the film structure, determined by an X‐ray diffraction data analysis, is compared and correlated with the mean grain size as a function of the deposition temperature. In both cases a linear increase with temperature and a very good agreement among the two structural parameters (grain and domain size) was found.