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Proximal electromagnetic shear forces [Note 1. Paper presented at the Fifth International Conference on Near ...]
Author(s) -
Eric Ayars,
D. E. Aspnes,
Patrick J. Moyer,
M. A. Paesler
Publication year - 1999
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1046/j.1365-2818.1999.00596.x
Subject(s) - shear force , shear (geology) , dissipation , mechanics , physics , classical mechanics , materials science , composite material , thermodynamics
We perform a simple model calculation to estimate the electromagnetically induced shear force caused by a current dissipation when a charged tip is moved parallel to a conducting material. For parameters typical in shear force imaging, the force is many orders of magnitude below reported values. Thus, proximal electromagnetic tip–sample forces can be neglected in discussions of shear force imaging.