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Signal components in the environmental scanning electron microscope
Author(s) -
Fletcher Al,
Thiel Bl,
Donald Am
Publication year - 1999
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1046/j.1365-2818.1999.00590.x
Subject(s) - secondary electrons , scanning electron microscope , electron , secondary emission , ionization , signal (programming language) , spurious relationship , backscatter (email) , environmental scanning electron microscope , electron ionization , analytical chemistry (journal) , electron microscope , chemistry , electron beam induced deposition , optics , atomic physics , materials science , physics , scanning transmission electron microscopy , ion , telecommunications , organic chemistry , chromatography , quantum mechanics , machine learning , computer science , wireless , programming language
We demonstrate that the gas‐amplified secondary electron signal obtained in the environmental scanning electron microscope has both desired and spurious components. In order to isolate the contributions of backscattered and secondary electrons, two sets of samples were examined. One sample consisted of a pair of materials having similar secondary emission coefficients but different backscatter coefficients, while the other sample had a pair with similar backscatter but different secondary emission coefficients. Our results show how the contribution of the two electron signals varies according to the pressure of the amplifying gas. Backscatter contributions, as well as background due to gas ionization from the primary beam, become significant at higher pressure. Furthermore, we demonstrate that the relative amplification efficiencies of various electron signals are dependent upon the chemistry of the gas.