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Study of dislocation structures near fatigue cracks using electron channelling contrast imaging technique (ECCI)
Author(s) -
AHMED J.,
WILKINSON A. J.,
ROBERTS S. G.
Publication year - 1999
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1046/j.1365-2818.1999.00574.x
Subject(s) - channelling , materials science , dislocation , transmission electron microscopy , electron backscatter diffraction , optics , diffraction , scanning electron microscope , cathode ray , electron , scanning transmission electron microscopy , electron microscope , diffraction topography , lüders band , electron diffraction , physics , nanotechnology , composite material , nuclear physics , ion , quantum mechanics
The fatigue of copper single crystals, orientated for single slip, has been studied using electron channelling contrast imaging in a scanning electron microscope. With the incident beam set at the Bragg condition, changes in the backscattered electron intensity occur as the beam is scanned over dislocations that cause a local tilting of the diffraction planes. This technique allows the evolution of dislocation structures over large areas to be followed through different stages of the fatigue life. Furthermore, it enables direct imaging of dislocation configurations at crack tips. The technique is compared with transmission electron microscopy and electron backscatter diffraction in its application to fatigue studies.