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Applicability of deconvolution and nonlinear optimization for reconstructing optical images from near‐field optical microscope images[Note 1. A part of this work was presented at OSA ...]
Author(s) -
Hatano H.,
Kawata S.
Publication year - 1999
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1046/j.1365-2818.1999.00564.x
Subject(s) - deconvolution , optics , finite difference time domain method , microscope , dielectric , strips , aperture (computer memory) , nonlinear system , materials science , iterative reconstruction , scattering , microscopy , optical microscope , physics , computer science , optoelectronics , artificial intelligence , acoustics , scanning electron microscope , quantum mechanics , composite material
We have made a computer reconstruction of a nanometric optical image of a sample from an observed near‐field optical image. The near‐field microscope image used for investigation was obtained numerically in three dimensions with the finite‐difference time‐domain (FDTD) method. The sample is dielectric substrate containing nanometric two strips made of dielectric or metal. Deconvolution with non‐negativity constraint is used to reconstruct the nanometric structure of dielectric strips, while nonlinear optimization is used to reconstruct the metallic strips. The difference in choice of reconstruction method between two samples comes from the difference in degree of interaction or multiple scattering of the sample structure and the probe. It is shown in the results, the resolution limit attainable in deconvolution is as fine as the size of aperture of probe.