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Polarization properties of the near‐field intensity reflected by metallic and dielectric one‐dimensional structures
Author(s) -
Wang S.,
Méndez E. R.
Publication year - 1999
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1046/j.1365-2818.1999.00559.x
Subject(s) - dielectric , polarization (electrochemistry) , optics , intensity (physics) , linear polarization , plane (geometry) , plane wave , materials science , metal , molecular physics , condensed matter physics , physics , chemistry , geometry , laser , optoelectronics , mathematics , metallurgy
We investigate the state of polarization and near‐field intensity distribution in the vicinity of rectangular groove objects ruled on metallic and dielectric materials. The sample is illuminated from the vacuum side by a linear combination of p‐ and s‐polarised waves. Two rigorous methods of solution are used and compared in calculations of the total intensity at constant height when the light is incident normally onto the surface. Some calculations of the total intensity in the ‘follow‐the‐profile mode’ are also presented. It is shown that in the constant height mode, the contrast in the image can be reversed as the plane of observation moves away from the mean plane of the sample. We also found that the state of polarization depends strongly on the material and the distance to the plane of detection.