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The height regulation of a near‐field scanning optical microscope probe tip
Author(s) -
Wang K.,
Wang X.,
Jin N.,
Huang W.,
Xu J.
Publication year - 1999
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1046/j.1365-2818.1999.00544.x
Subject(s) - optics , detector , non contact atomic force microscopy , signal (programming language) , vibration , atomic force acoustic microscopy , materials science , amplitude , shear force , tapping , acoustics , microscopy , physics , magnetic force microscope , kelvin probe force microscope , composite material , magnetization , quantum mechanics , computer science , magnetic field , programming language
A nonoptical detection of the optical fibre tip has been developed. By detecting the output signal from a tiny piezoelectric detector attached to the vibrating fibre tip, the distance between the fibre tip and the sample has been successfully controlled. The frequency responses of the system composed of tip, the dither and the detector have been studied. The difference between the shear‐force detection and the tapping‐mode detection is discussed. It is found that the shear force exerted on the tip reduces the vibration amplitude with an unvaried resonance frequency. However, in the tapping mode, the resonance frequency varies with the tip–sample distance as the force is exerted on the fibre tip only within a half period. This requires better adjustments for the tapping‐mode detection.