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Evaluation of nano‐optical probe from scanning near‐field optical microscope images
Author(s) -
Hosaka S.,
Shintani T.,
Kikukawa A.,
Itoh K.
Publication year - 1999
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1046/j.1365-2818.1999.00539.x
Subject(s) - nanometre , materials science , optics , optical microscope , microscope , near field scanning optical microscope , scanning probe microscopy , optical sectioning , microscopy , scanning electron microscope , optoelectronics , physics
We studied a nanometre‐sized optical probe in a scanning near‐field optical microscope. The probe profile is determined by using a knife‐edge method and a modulated transfer function evaluation method which uses nanometre‐sized line‐and‐space tungsten patterns (with spaces 1 μm to 50 nm apart) on SiO 2 substrates. The aluminium‐covered, pipette‐pulled fibre probe used here has two optical probes: one with a large diameter (350 nm) and the other with a small diameter (10 nm). The small‐diameter probe has an optical intensity ≈63 times larger than that of the large‐diameter probe, but the power is about 1/25 of that of the large probe.