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Ultrafast nonlinear sub‐wavelength solid immersion spectroscopy at T = 8 K: an alternative to nonlinear scanning near‐field optical microscopy
Author(s) -
Vollmer M.,
Giessen H.,
Stolz W.,
Rühle W. W.,
Knorr A.,
Koch S. W.,
Ghislain L.,
Elings V.
Publication year - 1999
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1046/j.1365-2818.1999.00508.x
Subject(s) - ultrashort pulse , microscopy , spectroscopy , optics , near field scanning optical microscope , materials science , wavelength , resolution (logic) , image resolution , nonlinear system , optical microscope , lambda , nonlinear optics , optoelectronics , laser , physics , scanning electron microscope , quantum mechanics , artificial intelligence , computer science
Pump–probe measurements were performed with a sub‐wavelength spatial resolution of 355 nm and a temporal resolution of 130 fs in a multiple quantum well sample at T = 8 K. A solid immersion lens was used to increase the spatial resolution to 0.41 λ, demonstrating that the limit of conventional microscopy was surpassed.