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Combined ultramicrotomy for AFM and TEM using a novel sample holder
Author(s) -
Yi Thomann,
Ralf Thomann,
Bar G,
M. Ganter,
B MacHutta,
Rolf Mülhaupt
Publication year - 1999
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1046/j.1365-2818.1999.00489.x
Subject(s) - sample (material) , atomic force microscopy , transmission electron microscopy , materials science , sample preparation , microscopy , conductive atomic force microscopy , microscope , nanotechnology , optics , chemistry , physics , chromatography
A new sample holder that allows combined microtomy for atomic force microscopy (AFM) and transmission electron microscopy (TEM) is described. The main feature of this sample holder is a small central part holding the sample. This central part fits into the head of an atomic force microscope. AFM measurements can be performed with a sample mounted in this central part of the sample holder. This makes the alignment of a microtomed bulk sample unnecessary, and offers the opportunity of an easy and fast combined sample preparation for AFM and TEM.