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Using the Hough transform for HOLZ line identification in convergent beam electron diffraction
Author(s) -
Stephan Krämer,
Joachim Mayer
Publication year - 1999
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1046/j.1365-2818.1999.00475.x
Subject(s) - optics , line (geometry) , diffraction , hough transform , pixel , physics , computational physics , lattice (music) , mathematics , geometry , image (mathematics) , computer science , artificial intelligence , acoustics
The Hough transform as a means for automatic line detection is applied for higher order Laue zone (HOLZ) line identification in convergent beam electron diffraction. The HOLZ line positions are commonly used to measure the strain state in the investigated material. Besides the automation, a very important aspect is the accuracy of the detected line positions. The limits are determined by the amount of noise in the pattern relative to the contrast of the HOLZ lines and the line width. Our investigations show that sub‐pixel resolution can be achieved routinely. We have also developed a new strain analysis procedure in which the dynamical shift of each individual line can be taken into account using a model based on several Ewald spheres with different radii. In comparison to the effective high voltage method, finer details of the dispersion surface can be considered, which increases the accuracy of the strain analysis. A measurement of the thermal expansion of aluminium is presented as a model experiment. The lattice constants were determined with an accuracy of about 10 −4 .