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High‐precision assessment of interface lattice offset by quantitative HRTEM
Author(s) -
Schweinfest,
F. Ernst,
Stefan Wagner,
Rühle
Publication year - 1999
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1046/j.1365-2818.1999.00465.x
Subject(s) - offset (computer science) , high resolution transmission electron microscopy , lattice (music) , transmission electron microscopy , materials science , interface (matter) , computer science , high resolution , crystallography , optics , nanotechnology , chemistry , physics , geology , acoustics , composite material , capillary number , capillary action , programming language , remote sensing
We introduce a new method to determine the ‘lattice offset’ or ‘rigid‐body shift’ between two crystals forming an interface. Our method relies on quantitative evaluation of high‐resolution transmission electron microscopy images. Employing the (001)‐orientated interface between Al and MgAl 2 O 4 in parallel orientation as a model system we demonstrate that we can assess the interface lattice offset with a precision in the picometre range.