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Composition mapping at high resolution
Author(s) -
Schwander P.,
Rau WD.,
Ourmazd A.
Publication year - 1998
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1046/j.1365-2818.1998.3400882.x
Subject(s) - high resolution transmission electron microscopy , limiting , image resolution , resolution (logic) , computer science , high resolution , range (aeronautics) , materials science , artificial intelligence , nanotechnology , remote sensing , geology , transmission electron microscopy , mechanical engineering , engineering , composite material
HRTEM images are traditionally interpreted by comparing experiment and simulation. However, quantitative agreement between experimental and simulated images is rarely achieved. It is thus highly desirable to extract quantitative information from HRTEM lattice images directly, without recourse to simulated images. Such ‘direct’ methods have been used to obtain high‐resolution composition maps from the local information content of HRTEM images. We review the real‐space techniques QUANTITEM and chemical mapping and delineate their application range. Finally, we demonstrate that both methods can be regarded as limiting cases of a more general approach.