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Quantitative atomic structure determination from HREM: viewpoints on accuracy and reliability
Author(s) -
Van Dyck D.
Publication year - 1998
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1046/j.1365-2818.1998.3370885.x
Subject(s) - viewpoints , reliability (semiconductor) , yield (engineering) , computer science , materials science , algorithm , computational physics , statistical physics , physics , thermodynamics , power (physics) , acoustics , metallurgy
The state of the art of atomic structure determination from HREM is discussed in the framework of parameter estimation. The role of direct holographic methods is to yield a starting structure for further quantitative refinement. The reason for the quantitative mismatch between theoretical and experimental images is discussed and an improved algorithm is suggested to speed up the calculations.