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Accurate structure determinations of very small (4–20 nm) areas, using refinement of dynamic electron diffraction data
Author(s) -
Zandbergen H. W.,
Jansen J.
Publication year - 1998
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1046/j.1365-2818.1998.3270880.x
Subject(s) - diffraction , electron diffraction , polyphase system , range (aeronautics) , crystallography , materials science , electron backscatter diffraction , computational physics , chemistry , analytical chemistry (journal) , physics , optics , quantum mechanics , composite material , chromatography
It is shown that accurate structure refinements are possible from electron diffraction data obtained using areas 4–20 nm in diameter and 4–20 nm thick. To obtain accurate atomic positions it is essential to take the dynamic diffraction fully into account, for which new software was developed. Examples (La 3 Ni 2 B 2 N 3 , Ba 2 Ca 3 Cu 5 O 10+δ and Ce 5 Cu 19 P 12 ) are given of the structure refinements of known and unknown structures with R ‐values in the range 2–6%. The procedure reported in this paper opens the way to structure determination of particles in many materials of industrial and scientific interest which cannot be solved by conventional structure determination (e.g. because of small size, heavily twinned materials or small fractions in polyphase materials).