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Estimation of the section thickness and optical disector height with a simple calibration method
Author(s) -
Korkmaz A.,
Tümkaya L.
Publication year - 1997
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1046/j.1365-2818.1997.2180777.x
Subject(s) - calibration , section (typography) , simple (philosophy) , sampling (signal processing) , optics , cross section (physics) , computer science , materials science , mathematics , physics , statistics , quantum mechanics , philosophy , epistemology , detector , operating system
The distance between the upper and lower surfaces of a section (i.e. the section thickness) can be measured with a microcator or a shaft encoder. In the present report, an alternative simple method is described for estimating the section thickness where such equipment is not available. The basic principle of the method is based on a calibration method already described in the literature. The main difference is that it enables one to make more precise measurements. Provided that the calibration and measurements are made properly, this method can be used in estimating the section thickness, optical disector heights, and in particular in the determination of the thickness sampling fraction for the optical fractionator.