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Stereological analysis of spatial surface processes
Author(s) -
Krejčíř P.,
Beneš V.
Publication year - 1997
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1046/j.1365-2818.1997.1500699.x
Subject(s) - estimator , surface (topology) , sampling (signal processing) , computer science , class (philosophy) , stereology , anisotropy , window (computing) , statistical physics , geometry , mathematics , statistics , optics , physics , artificial intelligence , computer vision , filter (signal processing) , operating system , medicine
The aim of the project presented here is to study statistical properties of surface intensity estimators using the model‐based approach to stationary surface structures. The class of estimators investigated enables a clear description of second order quantities in the anisotropic case, where the geometry of the surface structure, sampling design and observation window interact in a complex manner. Although the paper does not deal with real data, it includes theoretical examples and offers the readers a better understanding of stereological formulas up to second moments.