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Characterization of planar local arrangement by means of the Delaunay neighbourhood
Author(s) -
Bertram M.,
Wendrock H.
Publication year - 1996
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1046/j.1365-2818.1996.93374.x
Subject(s) - delaunay triangulation , neighbourhood (mathematics) , characterization (materials science) , planar , mathematics , voronoi diagram , statistical physics , geometry , physics , computer science , mathematical analysis , optics , computer graphics (images)
A suitable procedure is presented to characterize the neighbourhood in disperse micro‐structures by measuring the Delaunay neighbour distances and neighbour numbers. Results are discussed from simulation experiments with three germ‐grain models, regular arrangements and a seam‐like model. A plot of variation coefficients is suggested to differentiate between various random distributions of particles.