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Defect in cytokinesis of fission yeast induced by mutation in the WD40 repeat motif of a TFIID subunit
Author(s) -
Yamamoto Tohru,
Horikoshi Masami
Publication year - 1998
Publication title -
genes to cells
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.912
H-Index - 115
eISSN - 1365-2443
pISSN - 1356-9597
DOI - 10.1046/j.1365-2443.1998.00195.x
Subject(s) - cytokinesis , biology , schizosaccharomyces pombe , mutant , saccharomyces cerevisiae , schizosaccharomyces , genetics , microbiology and biotechnology , protein subunit , chimera (genetics) , yeast , gene , cell division , cell
Background: TBP‐associated factors contain a variety of structural motifs and their related in vivo significance has remained unclear. We have attempted to identify specific biological phenomena linked to a particular domain of a TAF by analysing domain‐exchanged chimeric mutants between Schizosaccharomyces pombe (Sp) and Saccharomyces cerevisiae (Sc) counterparts. Results: Contrary to the case of TBP, Sp TAF containing the WD40 repeat cannot be exchanged for its Sc counterpart, despite their highly conserved primary structures. This ‘species‐specific’ function locates in the N‐terminal region. The C‐terminal region, largely consisting of the WD40 repeat, is exchangeable for the corresponding region of its Sc counterpart. Growth of the strain harbouring this C‐terminal chimeric mutant is temperature‐sensitive. The chimeric gene product did not disappear at a restrictive temperature, a finding which strongly suggests that the growth defect is caused by an aberration in the interactions through the WD40 repeat structural motif. With temperature elevation, the chimeric mutants underwent drastic morphological changes due to a defect in cytokinesis. Conclusions: The WD40 repeat of TAF is primarily involved in reactions which might regulate cytokinesis in Sp.