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Influence of metal roughness on the near‐field generated by an aperture/apertureless probe
Author(s) -
Martin O. J. F.,
Paulus M.
Publication year - 2002
Publication title -
journal of microscopy
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.569
H-Index - 111
eISSN - 1365-2818
pISSN - 0022-2720
DOI - 10.1046/j.0022-2720.2001.00979.x
Subject(s) - surface finish , scattering , materials science , surface roughness , optics , polarization (electrochemistry) , aperture (computer memory) , aluminium , field (mathematics) , physics , composite material , chemistry , acoustics , mathematics , pure mathematics
Summary We study the influence of metal roughness on the near‐field distribution generated by an aperture or an apertureless (scattering) probe. Different experimental parameters are investigated: roughness magnitude, aperture form, distribution of the roughness. Our results show that aluminium roughness has a dramatic impact on the emission characteristics of a near‐field probe and in particular on its polarization sensitivity. Apertureless or scattering probes appear to be less sensitive to roughness and to provide a well confined field even with a somewhat rough probe.