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Mapping the capacitance of self-assembled monolayers at metal/electrolyte interfaces at the nanoscale by in-liquid scanning dielectric microscopy
Author(s) -
Rubén MillánSolsona,
Martí Checa,
Laura Fumagalli,
Gabriel Gomila
Publication year - 2020
Publication title -
nanoscale
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 2.038
H-Index - 224
eISSN - 2040-3372
pISSN - 2040-3364
DOI - 10.1039/d0nr05723a
Subject(s) - nanoscopic scale , materials science , electrolyte , dielectric , monolayer , capacitance , scanning probe microscopy , scanning capacitance microscopy , nanotechnology , scanning electrochemical microscopy , microscopy , self assembled monolayer , metal , chemical engineering , scanning electron microscope , analytical chemistry (journal) , optoelectronics , electrochemistry , scanning confocal electron microscopy , optics , electrode , chemistry , composite material , metallurgy , chromatography , engineering , physics
Organic self-assembled monolayers (SAMs) at metal/electrolyte interfaces have been thoroughly investigated both from fundamental and applied points of view. A relevant figure of merit of metal/SAM/electrolyte interfaces is the specific capacitance, which determines the charge that can be accumulated at the metal electrode. Here, we show that the specific capacitance of non-uniform alkanethiol SAMs at gold/electrolyte interfaces can be quantitatively measured and mapped at the nanoscale by in-liquid scanning dielectric microscopy in force detection mode. We show that sub-100 nm spatial resolution in ultrathin (<1 nm) SAMs can be achieved, largely improving the performance of current sensing characterization techniques. The present results provide access to study the dielectric properties of metal/SAM/electrolyte interfaces at scales that have remained unexplored until now.

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