Open AccessUsing resonant energy X-ray diffraction to extract chemical order parameters in ternary semiconductors
Author(s) -
Rekha R. Schnepf,
Ben LevyWendt,
M. Brooks Tellekamp,
Brenden R. Ortiz,
Celeste L. Melamed,
Laura T. Schelhas,
Kevin H. Stone,
Michael F. Toney,
Eric S. Toberer,
Adele C. Tamboli
Publication year - 2020
Publication title -
journal of materials chemistry c
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.899
H-Index - 128
eISSN - 2050-7534
pISSN - 2050-7526
DOI - 10.1039/c9tc06699c
Subject(s) - materials science , diffraction , ternary operation , semiconductor , x ray crystallography , thin film , energy (signal processing) , order (exchange) , crystallography , condensed matter physics , optoelectronics , nanotechnology , optics , physics , quantum mechanics , chemistry , finance , computer science , economics , programming language
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