Open AccessHigh resolution noncontact atomic force microscopy imaging with oxygen-terminated copper tips at 78 K
Author(s) -
Damla Yesilpinar,
Bertram Schulze Lammers,
Alexander Timmer,
Saeed Amirjalayer,
Harald Fuchs,
Harry Mönig
Publication year - 2020
Publication title -
nanoscale
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 2.038
H-Index - 224
eISSN - 2040-3372
pISSN - 2040-3364
DOI - 10.1039/c9nr10450j
Subject(s) - copper , atomic force microscopy , materials science , microscopy , non contact atomic force microscopy , kelvin probe force microscope , conductive atomic force microscopy , nanotechnology , optics , metallurgy , physics
AFM experiments at 78 K with an atomically defined O-terminated Cu tip allow determining bond lengths of an organic molecule with high precision.
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