Local chemical composition of nanophase-separated polymer brushes | Zendy

Marlena Filimon | Zendy; Ilona Kopf | Zendy; Diedrich A. Schmidt | Zendy; Erik Bründermann | Zendy; Jürgen Rühe | Zendy; Svetlana Santer | Zendy; Martina Havenith | Zendy

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Local chemical composition of nanophase-separated polymer brushes

Author(s) -

Marlena Filimon,

Ilona Kopf,

Diedrich A. Schmidt,

Erik Bründermann,

Jürgen Rühe,

Svetlana Santer,

Martina Havenith

Publication year - 2011

Publication title -

physical chemistry chemical physics

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 1.053

H-Index - 239

eISSN - 1463-9084

pISSN - 1463-9076

DOI - 10.1039/c0cp02756a

Subject(s) - chemical composition , polymer , polymer science , composition (language) , chemical engineering , materials science , nanotechnology , chemistry , polymer chemistry , composite material , organic chemistry , art , engineering , literature

Using scattering scanning nearfield infrared microscopy (s-SNIM), we have imaged the nanoscale phase separation of mixed polystyrene-poly(methyl methacrylate) (PS-PMMA) brushes and investigated changes in the top layer as a function of solvent exposure. We deduce that the top-layer of the mixed brushes is composed primarily of PMMA after exposure to acetone, while after exposure to toluene this changes to PS. Access to simultaneously measured topographic and chemical information allows direct correlation of the chemical morphology of the sample with topographic information. Our results demonstrate the potential of s-SNIM for chemical mapping based on distinct infrared absorption properties of polymers with a high spatial resolution of 80 nm × 80 nm.

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