Open AccessDetermination of ferroelectric contributions to electromechanical response by frequency dependent piezoresponse force microscopy
Author(s) -
Daehee Seol,
Seongjae Park,
O.V. Varenyk,
Shinbuhm Lee,
Ho Nyung Lee,
An. Morozovska,
Yunseok Kim
Publication year - 2016
Publication title -
scientific reports
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.24
H-Index - 213
ISSN - 2045-2322
DOI - 10.1038/srep30579
Subject(s) - piezoresponse force microscopy , ferroelectricity , microscopy , materials science , nanotechnology , optoelectronics , physics , optics , dielectric
Hysteresis loop analysis via piezoresponse force microscopy (PFM) is typically performed to probe the existence of ferroelectricity at the nanoscale. However, such an approach is rather complex in accurately determining the pure contribution of ferroelectricity to the PFM. Here, we suggest a facile method to discriminate the ferroelectric effect from the electromechanical (EM) response through the use of frequency dependent ac amplitude sweep with combination of hysteresis loops in PFM. Our combined study through experimental and theoretical approaches verifies that this method can be used as a new tool to differentiate the ferroelectric effect from the other factors that contribute to the EM response.