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The linear artifact in enhanced depth imaging spectral domain optical coherence tomography
Author(s) -
Zuo Chen,
Lan Mi,
Shasha Yang,
Xinxing Guo,
Hui Xiao,
Xing Liu
Publication year - 2017
Publication title -
scientific reports
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.24
H-Index - 213
ISSN - 2045-2322
DOI - 10.1038/s41598-017-08811-3
Subject(s) - optical coherence tomography , artifact (error) , tomography , computer science , artificial intelligence , optics , physics
Optical coherence tomography (OCT) is a valuable ancillary test in the diagnosis and management of chorioretinal disease. The evaluation of choroid thickness using OCT has become the focus of clinical applications. We report a linear artifact that acts as a confounding factor in choroidal thickness measurements by enhanced depth imaging OCT. We found that the linear artifact is located stably at a depth of 485  μ m beneath the retinal pigment epithelium in 81.88% of subjects. The study suggested that the linear artifact was a confounding factor in assessing choroidal thickness and that caution should be used in the interpretation of the choroidal thickness, especially when it is approximately 485 μ m.

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