Open AccessQuadriwave lateral shearing interferometric microscopy with wideband sensitivity enhancement for quantitative phase imaging in real time
Author(s) -
Taotao Ling,
Jianjun Jiang,
Rui Zhang,
Yongying Yang
Publication year - 2017
Publication title -
scientific reports
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.24
H-Index - 213
ISSN - 2045-2322
DOI - 10.1038/s41598-017-00053-7
Subject(s) - interferometry , optics , visualization , astronomical interferometer , microscopy , sensitivity (control systems) , computer science , shearing (physics) , microscope , phase (matter) , wideband , phase imaging , phase retrieval , computer vision , artificial intelligence , materials science , physics , fourier transform , electronic engineering , engineering , quantum mechanics , composite material
Real-time quantitative phase imaging has tremendous potential in investigating live biological specimens in vitro . Here we report on a wideband sensitivity-enhanced interferometric microscopy for quantitative phase imaging in real time by employing two quadriwave lateral shearing interferometers based on randomly encoded hybrid gratings with different lateral shears. Theoretical framework to analyze the measurement sensitivity is firstly proposed, from which the optimal lateral shear pair for sensitivity enhancement is also derived. To accelerate the phase retrieval algorithm for real-time visualization, we develop a fully vectorized path-independent differential leveling phase unwrapping algorithm ready for parallel computing, and the framerate for retrieving the phase from each pair of two 4 mega pixel interferograms is able to reach 47.85 frames per second. Experiment results demonstrate that the wideband sensitivity-enhanced interferometric microscopy is capable of eliminating all the periodical error caused by spectral leaking problem and reducing the temporal standard deviation to the half level compared with phase directly retrieved by the interferogram. Due to its high adaptability, the wideband sensitivity-enhanced interferometric microscopy is promising in retrofitting existing microscopes to quantitative phase microscopes with high measurement precision and real-time visualization.