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Inter‐crystallite nanoretention of self‐etching adhesives at enamel imaged by transmission electron microscopy
Author(s) -
Hannig Matthias,
Bock Henning,
Bott Burkard,
HothHannig Wiebke
Publication year - 2002
Publication title -
european journal of oral sciences
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.802
H-Index - 93
eISSN - 1600-0722
pISSN - 0909-8836
DOI - 10.1034/j.1600-0722.2002.21326.x
Subject(s) - enamel paint , crystallite , materials science , etching (microfabrication) , adhesive , phosphoric acid , composite material , transmission electron microscopy , scanning electron microscope , layer (electronics) , nanotechnology , metallurgy
The purpose of this in vitro study was to analyse the mode of action of self‐etching adhesive systems when applied for resin‐to‐enamel bonding. Transmission electron microscopy was used to investigate the enamel–resin interface after application of non‐rinsing self‐etching adhesive systems based on phosphoric acid estered methacrylates (Clearfil Liner Bond 2, Clearfil SE Bond, Etch & Prime 3.0 and Resulcin AquaPrime) compared with conventional phosphoric acid etching and bonding (Heliobond). Non‐decalcified ultrathin sections from the interface between enamel and self‐etching adhesive systems revealed a 1.5–3.2‐µm deep enamel surface layer characterized by a less‐dense arrangement of enamel crystallites separated from each other by nanometer‐sized spaces. A 1.5–3.2‐µm wide, netlike resinous structure was observed in corresponding decalcified specimens, indicating that self‐etching priming agents dissolve the peripheral and central part of the enamel crystallites, while simultaneously promoting inter‐ and intra‐crystallite monomer infiltration. A similar pattern, but greater depth (6.9 µm) of enamel surface hybridization was found in the phosphoric acid‐etched and bonded specimens. The nanoretentive interlocking between enamel crystallites and resin could explain the potential of self‐etching adhesive systems in resin‐to‐enamel bonding despite the less distinct enamel etching pattern observed in scanning electron microscopy investigations.