Premium
A new microtomographic technique for non‐invasive evaluation of the bone structure around implants
Author(s) -
Sennerby Lars,
Wennerberg Ann,
Pasop Freek
Publication year - 2001
Publication title -
clinical oral implants research
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 2.407
H-Index - 161
eISSN - 1600-0501
pISSN - 0905-7161
DOI - 10.1034/j.1600-0501.2001.012001091.x
Subject(s) - materials science , high resolution , computed tomographic , biomedical engineering , tomography , titanium , wafer , quantitative assessment , computed tomography , nuclear medicine , radiology , geology , medicine , remote sensing , metallurgy , risk analysis (engineering) , nanotechnology
A new X‐ray microtomographic technique for non‐invasive assessment of the structure of bone surrounding implants was tested. Three titanium microimplants retrieved directly ( n =2) or 6 months ( n =1) after insertion in 3 patients were used as test samples. Two samples were used dry and one was embedded in plastic resin prior to microtomography. The technique provided high‐resolution consecutive cross‐sectional X‐ray images of the specimens with a slice‐to‐slice distance of 4.4 to 11.0 μm. The pictures could be imported into an image analysing software with which semiautomatic quantitative measurement of the bone area and three‐dimensional images of the specimens could be made. It is suggested that the technique may be used for non‐invasive assessment of the bone structure around implants. Further studies are needed to evaluate the accuracy of the technique, for instance by comparing tomographic sections with histologic ones.