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Transmission electron diffraction and microscopy of synthetic high pressure MgSiO 3 phase with perovskite structure
Author(s) -
Madon M.,
Bell P. M.,
Mao H. K.,
Poirier J. P.
Publication year - 1980
Publication title -
geophysical research letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 2.007
H-Index - 273
eISSN - 1944-8007
pISSN - 0094-8276
DOI - 10.1029/gl007i009p00629
Subject(s) - transmission electron microscopy , tetragonal crystal system , diffraction , nucleation , electron diffraction , materials science , perovskite (structure) , phase (matter) , crystallography , x ray crystallography , selected area diffraction , mineralogy , optics , chemistry , crystal structure , nanotechnology , physics , organic chemistry
Synthetic perovskite (Mg, Fe) SiO 3 prepared in a diamond anvil high pressure cell at 375 kbar and 1000°C has been examined in transmission electron microscopy and selected area diffraction. The crystals grow, probably by nucleation and growth, as small lozenge platelets on {111} planes of the pseudo cubic ideal cell. The diffraction patterns are compatible with a pseudo tetragonal cell with parameters twice as large as those previously determined by X‐ray diffraction.