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Lunar reflectivity from Extreme Ultraviolet Explorer imaging and spectroscopy of the full moon
Author(s) -
Flynn Brian C.,
Vallerga John V.,
Gladstone G. Randall,
Edelstein Jerry
Publication year - 1998
Publication title -
geophysical research letters
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 2.007
H-Index - 273
eISSN - 1944-8007
pISSN - 0094-8276
DOI - 10.1029/98gl02483
Subject(s) - extreme ultraviolet , extreme ultraviolet lithography , brightness , albedo (alchemy) , wavelength , surface brightness , optics , astrophysics , physics , contrast (vision) , reflectivity , ultraviolet , spectroscopy , geometric albedo , astronomy , photometry (optics) , galaxy , laser , art , stars , performance art , art history
We present new imaging and spectroscopic observations obtained with the Extreme Ultraviolet Explorer (EUVE). Our 200 Å image shows high contrast (33%) and complete albedo reversal, i.e., contrast is reversed relative to the Moon in visible light. The high contrast at 200 Å suggests the potential of the EUV spectral region for surface compositional studies. The 600 Å image is surprisingly bland (<3% contrast). We derive surface reflectivities (geometric albedos) of individual surface regions for the first time with values of 0.11–0.15% at 200 Å, and 2.5% at 600 Å. Reflectivities derived from the medium‐ (MW) and long‐wavelength (LW) spectra (140–380 Å and 280–760 Å) show that lunar reflectivity decreases by a factor of approximately 60 over the 700 to 150 Å range. Our data further suggest that the Moon's brightness vs phase may behave differently than at longer wavelengths, and that surface fluorescence may contribute to the observed EUV brightness.